Online Free Shipping Bookstore

This item can be found in:

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits: The System on Chip Approach (Paperback)

Sun, Yichuang

Paperback

$155.00

delivery-truck

United States: Delivered within 3-5 working days

Rest of the world: within 7-14 working days

Enjoy Free Shipping on Orders Over $25 Within the U.S. and Over $50 Internationally

Share On:

Book information

ISBN 13
9780863417450
ISBN 10
863417450
Book Publisher
Institution of Engineering & Technology
Format
Paperback

You may also be interested in...

Measurement for Evaluation in Kinesiology (Revised) (Paperback)

$95.95

Paperback

Generating Analog IC Layouts with Laygen II (2013) (Paperback)

$54.99

Paperback

Bridge Health Monitoring, Maintenance and Safety: Special Topic Volume with Invited Peer Reviewed Papers Only

$124.00

Paperback

Share On:

    0
    Your Cart
    Your cart is empty
    ×